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Tungsten Filament Scanning Electron Microscope
KYKY - EM69 Series
Tungsten Filament Scanning Electron Microscope
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Tungsten Filament Scanning Electron Microscope
The EM69 series scanning electron microscope with excellent imaging
wide range of expansion attachments
optional low vacuum modules
and rich automation functions, various possibility of customization
Features Functions Accessories Parameter Application
Features
Optional low vacuum modules(LVSE,LVBSE)
Rich automation functions
Column/Chamber/Electric System Customization
Optional Large size chamber
Wide field navigation camera
Rich expanding attachments
Functions
Simultaneous imaging with different detectors
Dual-channel images display of SE and BSE Signal mixing ratio of different detectors can be set freely BSE detector, to detect the composition characterstics of the sample surface
Particle size analysis
The composite image processing algorithm of deep learning is adopted to automatically identify the proportional scale, accurately identify the particles in the image, and count and export various morphological parameters for more comprehensive particle size and particle shape statistics. (Aluminum-doped cobalt carbonate; Silicon dioxide; Statistical results; Particle size analysis results)
Dimension measurement
With extensive image measurement functions such as distance, angle, horizontal/vertical line, etc
Pre-vacuum chamber Loadlock
Sample diameter: ≤ 75mm, height: ≤ 15mm; sample change within 2 minutes
Large image stitching
Continuous automatic image collection Accurate stitching of multiple images to generate large and high-resolution images（Before stitching；Stitching effect of 2 images；Stitching effect of 9 images）
Electron beam lithography
The SEM-based electron beam lithography (EBL) system allows precise control of the scanning path and energy deposition of the electron beam to realize high-resolution patterning exposure. The system adopts advanced electron beam scanning control technology, which supports flexible and diverse pattern design and precise control. In addition to the electron beam exposure function, it also retains the original observation function of the SEM, which allows users to complete the observation and processing of samples on the same equipment, improving work efficiency and convenience.
Accessories
EDS
EDS
Energy dispersive spectrometer
EBSD
EBSD
Electron back scattered diffraction
CL
CL
Cathodoluminescence detector
STEM
STEM
Scanning transmission electron microscope
Transition chamber
Transition chamber
Heating stage
Heating stage
Cooling-heating stage
Cooling-heating stage
Tensile stage
Tensile stage
Parameter

英文69参数.jpg

Provide customized solutions
Provide you with professional non-standard customized services to meet various application scenarios.
Application
PCB Surface Nickel Lattice
Anode Material
Barium Titanate
Copper Foil
Metal Cross-section
Rubber
Email
kykysem@kyky.com.cn
Address
101-203, 2F, Building 1, Yard 6, Rongxing North 1st Street, Beijing Economic and Technological Development Zone, Beijing, China
Contact Us
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010-6257 1593
+86 186 1145 5343
After-sale Service Hotline
010-8254 8117
+86 186 1140 0562
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